Jump to ContentJump to Main Navigation
Atomic Force Microscopy$
Users without a subscription are not able to see the full content.

Peter Eaton and Paul West

Print publication date: 2010

Print ISBN-13: 9780199570454

Published to Oxford Scholarship Online: May 2010

DOI: 10.1093/acprof:oso/9780199570454.001.0001

Show Summary Details
Page of

PRINTED FROM OXFORD SCHOLARSHIP ONLINE (www.oxfordscholarship.com). (c) Copyright Oxford University Press, 2019. All Rights Reserved. Under the terms of the licence agreement, an individual user may print out a PDF of a single chapter of a monograph in OSO for personal use (for details see www.oxfordscholarship.com/page/privacy-policy).date: 16 July 2019

AFM image artefacts

AFM image artefacts

(p.121) Chapter 6 AFM image artefacts
Atomic Force Microscopy

Peter Eaton

Paul West

Oxford University Press

AFM, like any other measurement technique, is prone to artefacts. These can arise due to the AFM probe, the scanner, the instrument electronics, from the laboratory environment, or from many outer sources. Some artefacts are obvious to experienced users, while others are more subtle. Identifying the artefacts so that they can be explained and excluded from analysis is one of the most difficult tasks facing new AFM users. This chapter explains the origins of the artefacts that occur in AFM images, and explains what can be done to avoid them.

Keywords:   AFM, artefacts, image artefacts, probe convolution, scanners

Oxford Scholarship Online requires a subscription or purchase to access the full text of books within the service. Public users can however freely search the site and view the abstracts and keywords for each book and chapter.

Please, subscribe or login to access full text content.

If you think you should have access to this title, please contact your librarian.

To troubleshoot, please check our FAQs , and if you can't find the answer there, please contact us .