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Atomic Force Microscopy$
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Peter Eaton and Paul West

Print publication date: 2010

Print ISBN-13: 9780199570454

Published to Oxford Scholarship Online: May 2010

DOI: 10.1093/acprof:oso/9780199570454.001.0001

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Measuring AFM images

Measuring AFM images

(p.82) Chapter 4 Measuring AFM images
Atomic Force Microscopy

Peter Eaton

Paul West

Oxford University Press

This chapter provides a detailed, step‐by‐step guide to measuring images with an AFM. Standard techniques for preparation of a wide range of samples are given. Instructions and tips on instrumental set‐up, optical alignment, sample approach and optimization of scanning, makes this an invaluable section for new users and educators. For experienced users, the information will help them to understand more deeply the process of scanning AFM images, so they can get better, more reproducible images. Additional sections cover optimization for high‐resolution measurements and making force spectroscopy measurements.

Keywords:   sample preparation, guidelines, measurements, imaging

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