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Introduction to Scanning Tunneling MicroscopySecond Edition$
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C. Julian Chen

Print publication date: 2007

Print ISBN-13: 9780199211500

Published to Oxford Scholarship Online: September 2007

DOI: 10.1093/acprof:oso/9780199211500.001.0001

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Piezoelectric Scanner

Piezoelectric Scanner

Chapter:
(p.245) Chapter 9 Piezoelectric Scanner
Source:
Introduction to Scanning Tunneling Microscopy
Author(s):

C. Julian Chen

Publisher:
Oxford University Press
DOI:10.1093/acprof:oso/9780199211500.003.0009

This chapter discusses the physical principle, design, and characterization of piezoelectric scanners, which is the heart of STM and AFM. The concept of piezoelectricity is introduced at the elementary level. Two major piezoelectric materials used in STM and AFM, quartz and lead zirconate titanate ceramics (PZT), are described. After a brief discussion of the tripod scanner and the bimorph, much emphasis is on the most important scanner in STM and AFM: the tube scanner. A step-by-step derivation of the deflection formula is presented. The in-situ testing and calibration method based on pure electrical measurements is described. The formulas of the resonance frequencies are also presented. To compensate the non-linear behavior of the tube scanner, an improved design, the S-scanner, is described. Finally, a step-by-step procedure to repole a depoled piezo is presented.

Keywords:   piezoelectricity, quartz, lead zirconate titanate ceramics, PZT, piezoelectric constant, bimorph, tripod scanner, tube scanner, deflection formula, resonance frequency

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