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Introduction to Scanning Tunneling MicroscopySecond Edition$
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C. Julian Chen

Print publication date: 2007

Print ISBN-13: 9780199211500

Published to Oxford Scholarship Online: September 2007

DOI: 10.1093/acprof:oso/9780199211500.001.0001

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Nanomechanical Effects

Nanomechanical Effects

Chapter:
(p.219) Chapter 8 Nanomechanical Effects
Source:
Introduction to Scanning Tunneling Microscopy
Author(s):

C. Julian Chen

Publisher:
Oxford University Press
DOI:10.1093/acprof:oso/9780199211500.003.0008

This chapter discusses the effect of force and deformation of the tip apex and the sample surface in the operation and imaging mechanism of STM and AFM. Because the contact area is of atomic dimension, a very small force and deformation would generate a large measurable effect. Three effects are discussed. First is the stability of the STM junction, which depends on the rigidity of the material. For soft materials, hysterisis is more likely. For rigid materials, the approaching and retraction cycles are continuous and reproducible. Second is the effect of force and deformation to the STM imaging mechanism. For soft material such as graphite, force and deformation can amplify the observed corrugation. For hard materials as most metals, force and deformation can decrease the observed corrugation. Finally, the effect of force and deformation on tunneling barrier height measurements is discussed.

Keywords:   force, deformation, instability, corrugation amplitude, giant corrugation, graphite, metals, tunneling barrier height

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