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Introduction to Scanning Tunneling MicroscopySecond Edition$
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C. Julian Chen

Print publication date: 2007

Print ISBN-13: 9780199211500

Published to Oxford Scholarship Online: September 2007

DOI: 10.1093/acprof:oso/9780199211500.001.0001

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Scanning Tunneling Spectroscopy

Scanning Tunneling Spectroscopy

Chapter:
(p.331) Chapter 14 Scanning Tunneling Spectroscopy
Source:
Introduction to Scanning Tunneling Microscopy
Author(s):

C. Julian Chen

Publisher:
Oxford University Press
DOI:10.1093/acprof:oso/9780199211500.003.0014

This chapter discusses various aspects of scanning tunneling spectroscopy (STS). It is an extension of the classical tunneling spectroscopy experiment to nanometer-scale or atomic-scale features on the sample surface. First, the electronics for STS is presented. The nature of STS as a convolution of tip DOS and sample DOS is discussed. Special tip treatment for the STS experiment, often different from the atomic-resolution STM, is described. The purpose is to produce tips with flat DOS, instead of special tip orbitals. A useful data process method, the Feenstra parameter, is presented. Experimental methods to determine tip DOS is discussed. A detailed account of the inelastic scanning tunneling spectroscopy, or STM-IETS, is then discussed. It includes the principles, the electronics, and the instrumental broadening of the features. This chapter concludes with the observation of the isotope effect in STM-IETS, a definitive signature of the vibrational spectra of molecules.

Keywords:   STS, tip treatment, Feenstra parameter, inelastic scanning tunneling spectroscopy, STM-IETS, instrumental broadening, isotope effect

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