Jump to ContentJump to Main Navigation
Introduction to Scanning Tunneling MicroscopySecond Edition$
Users without a subscription are not able to see the full content.

C. Julian Chen

Print publication date: 2007

Print ISBN-13: 9780199211500

Published to Oxford Scholarship Online: September 2007

DOI: 10.1093/acprof:oso/9780199211500.001.0001

Show Summary Details
Page of

PRINTED FROM OXFORD SCHOLARSHIP ONLINE (www.oxfordscholarship.com). (c) Copyright Oxford University Press, 2019. All Rights Reserved. An individual user may print out a PDF of a single chapter of a monograph in OSO for personal use. date: 17 November 2019

Electronics and Control

Electronics and Control

Chapter:
(p.283) Chapter 11 Electronics and Control
Source:
Introduction to Scanning Tunneling Microscopy
Author(s):

C. Julian Chen

Publisher:
Oxford University Press
DOI:10.1093/acprof:oso/9780199211500.003.0011

This chapter discusses electronics and computer interfaces for STM and AFM. For STM, the detection of the minute tunneling current is of paramount importance. Thus, the basic concepts and analysis of the current amplifier, or more accurately speaking, the transimpedence amplifier, is discussed. It includes the typical circuits and an analysis of the gain, noise, frequency response, microphone effect due to the coaxial cable, and the logarithmic amplifier to make the distance dependence of the output signal linear. the feedback system is then discussed, including a typical circuit, as well as the analyses of the steady-state response and the transient response. Finally, the architecture of the computer interface system with the algorithm of automatic approaching is discussed.

Keywords:   tunneling current, current amplifier, transimpedence amplifier, gain, noise, frequency response, microphone effect, logarithmic amplifier, feedback system, steady-state response

Oxford Scholarship Online requires a subscription or purchase to access the full text of books within the service. Public users can however freely search the site and view the abstracts and keywords for each book and chapter.

Please, subscribe or login to access full text content.

If you think you should have access to this title, please contact your librarian.

To troubleshoot, please check our FAQs , and if you can't find the answer there, please contact us .