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High-Resolution Electron Microscopy$
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John C. H. Spence

Print publication date: 2013

Print ISBN-13: 9780199668632

Published to Oxford Scholarship Online: January 2014

DOI: 10.1093/acprof:oso/9780199668632.001.0001

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Scanning transmission electron microscopy and Z-contrast

Scanning transmission electron microscopy and Z-contrast

Chapter:
(p.233) 8 Scanning transmission electron microscopy and Z-contrast
Source:
High-Resolution Electron Microscopy
Author(s):

John C. H. Spence

Publisher:
Oxford University Press
DOI:10.1093/acprof:oso/9780199668632.003.0008

Chapter 8 reviews the theory of scanning transmission electron microscopy using a field-emission electron microscope. The bright-field, dark-field, and high-angle dark-field modes are described, and the reciprocity theorem explained. The theory of partial coherence is applied in terms of detector functions. Three-dimensional tomography using STEM is reviewed, as is the incoherence Z-contrast method. The effects of electron channelling are explained, and artefacts due to multiple scattering outlined.

Keywords:   STEM, Z-contrast, tomography, HAADF, incoherent imaging

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