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High-Resolution Electron Microscopy$
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John C. H. Spence

Print publication date: 2013

Print ISBN-13: 9780199668632

Published to Oxford Scholarship Online: January 2014

DOI: 10.1093/acprof:oso/9780199668632.001.0001

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Measurement of electron-optical parameters

Measurement of electron-optical parameters

Chapter:
(p.289) 10 Measurement of electron-optical parameters
Source:
High-Resolution Electron Microscopy
Author(s):

John C. H. Spence

Publisher:
Oxford University Press
DOI:10.1093/acprof:oso/9780199668632.003.0010

Chapter 10 summarizes the main electron-optical parameters on which image quality depends, and shows how to measure these. These include lens aberrations, for which diffractograms and Ronchigrams must be used. Magnification calibration, coherence measurement, astigmatism, spherical aberration constants, electron wavelength, and resolution measurement are some of the topics covered.

Keywords:   resolution measurement, Ronchigrams, aberration correction, coherence measurement

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