- Title Pages
- Preface to the Fourth Edition
- Preface to the Third Edition
- Symbols and abbreviations
- 1 Preliminaries
- 2 Electron optics
- 3 Wave optics
- 4 Coherence and Fourier optics
- 5 TEM imaging of thin crystals and their defects
- 6 Imaging molecules: radiation damage
- 7 Image processing, super-resolution, and diffractive imaging
- 8 Scanning transmission electron microscopy and <b><i>Z</i></b>-contrast
- 9 Electron sources and detectors
- 10 Measurement of electron-optical parameters
- 11 Instabilities and the microscope environment
- 12 Experimental methods
- 13 Associated techniques
- Appendix 1
- Appendix 2 Use of an absorption function to represent the objective aperture effect
- Appendix 3 Resolution-limiting factors and their wavelength dependences
- Appendix 4 What is a structure image?
- Appendix 5 The challenge of HREM
- (p.1) 1 Preliminaries
- High-Resolution Electron Microscopy
John C. H. Spence
- Oxford University Press
Chapter 1 describes the principles and simplest theory of phase contrast imaging in microscopy.
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