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Quantum Confined Laser DevicesOptical gain and recombination in semiconductors$
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Peter Blood

Print publication date: 2015

Print ISBN-13: 9780199644513

Published to Oxford Scholarship Online: November 2015

DOI: 10.1093/acprof:oso/9780199644513.001.0001

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Single-pass measurement of gain and emission

Single-pass measurement of gain and emission

Chapter:
(p.323) 18 Single-pass measurement of gain and emission
Source:
Quantum Confined Laser Devices
Author(s):

Peter Blood

Publisher:
Oxford University Press
DOI:10.1093/acprof:oso/9780199644513.003.0018

The most direct measurement of gain is given by the fractional increase in energy with distance as light makes a single pass through the medium. Amplified spontaneous emission is observed over a single pass, usually by having absorbing regions or low-reflectivity mirrors at one end of the structure. Measurements can be made on laser structures, but not while operating as a laser. The intensity of light from the end of the structure is measured as the amplifying length is varied, so these are known as ‘variable stripe length’ methods. The chapter begins with a short survey of the development of this approach, followed by a detailed account of the electrically pumped ‘segmented contact’ or ‘multi-section’ method, much of which is relevant to other realisations of the experiment, such as optical excitation. Calibration using the population inversion factor gives the radiative current and internal efficiency.

Keywords:   single pass, stripe length, multi-section, segmented contact, optical excitation, radiative current, efficiency, population inversion factor

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