Fundamental transmission electron microscopy
Fundamental transmission electron microscopy covers the topics of resolution, electron optics, image recording systems and image distortions and how they can be handled by hardware (Cs-correctors) and software. The interaction of electrons with matter starts with the individual atom and the atomic scattering factor. Special emphasis is placed on elastically scattered electrons, since those are the ones used for forming images of the atomic structure. The use of inelastically scattered electrons is briefly mentioned, for example in HAADF – high-angle annular dark field imaging of atomic structure.
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