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Atomic Force Microscopy$
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Peter Eaton and Paul West

Print publication date: 2010

Print ISBN-13: 9780199570454

Published to Oxford Scholarship Online: May 2010

DOI: 10.1093/acprof:oso/9780199570454.001.0001

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AFM image processing and analysis

AFM image processing and analysis

Chapter:
(p.103) Chapter 5 AFM image processing and analysis
Source:
Atomic Force Microscopy
Author(s):

Peter Eaton

Paul West

Publisher:
Oxford University Press
DOI:10.1093/acprof:oso/9780199570454.003.0005

This chapter describes procedures for image processing, display and analysis. AFM data is particularly suitable for further processing and analysis, and has some particular requirements, due to the three‐dimensional nature of the date obtained. Proper use of image processing techniques is important in order to enable further analysis while accurately reflecting the real nature of the sample, and avoiding the introduction of errors. Various methods of optimizing the display of the data are described, and their suitability for different uses is compared. In addition, there are many powerful analysis routines for AFM data, which can be essential to extract the most information from image data. This chapter describes how to maintain data integrity, and how to optimize and process the data for best effect.

Keywords:   data processing, image processing, image analysis, data display

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