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Atomic Force Microscopy$
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Peter Eaton and Paul West

Print publication date: 2010

Print ISBN-13: 9780199570454

Published to Oxford Scholarship Online: May 2010

DOI: 10.1093/acprof:oso/9780199570454.001.0001

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AFM instrumentation

AFM instrumentation

Chapter:
(p.9) Chapter 2 AFM instrumentation
Source:
Atomic Force Microscopy
Author(s):

Peter Eaton

Paul West

Publisher:
Oxford University Press
DOI:10.1093/acprof:oso/9780199570454.003.0002

This chapter describes the design of modern AFM instruments in detail. It shows both how the instruments are built, and how they work. There are descriptions of the mechanical, electronic, and software design of the instrument, as well as a section on the design of AFM probes, one of the most important components in any AFM. For the instrument user, understanding how the instrument works can greatly improve the results obtained, and this chapter has all the information an AFM user could need about how AFMs work, and more importantly, why they work that way.

Keywords:   instrument, hardware, software, probes, cantilevers, design, electronics

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