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Advanced Tomographic Methods in Materials Research and Engineering$
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John Banhart

Print publication date: 2008

Print ISBN-13: 9780199213245

Published to Oxford Scholarship Online: May 2008

DOI: 10.1093/acprof:oso/9780199213245.001.0001

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FUNDAMENTALS OF ELECTRON TOMOGRAPHY

FUNDAMENTALS OF ELECTRON TOMOGRAPHY

Chapter:
(p.305) 11 FUNDAMENTALS OF ELECTRON TOMOGRAPHY
Source:
Advanced Tomographic Methods in Materials Research and Engineering
Author(s):

Paul A. Midgley

Matthew Weyland

Publisher:
Oxford University Press
DOI:10.1093/acprof:oso/9780199213245.003.0011

This chapter reviews the fundamentals of electron tomography and highlights aspects that are unique to using electrons. Each imaging mode used for electron tomography is discussed. Their benefits and drawbacks are outlined with examples of the diverse range of materials now being studied. Topics covered include tomography using the electron microscope, alignment and reconstruction, bright-field and dark-field electron tomography, HAADF STEM tomography, and EFTEM tomography.

Keywords:   bright-field electron tomography, dark-field electron tomography, HAADF STEM tomography, EFTEM tomography

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