Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties and Superconductor Critical-Current Testing
Jack Ekin
Abstract
This book presents an integrated, step-by-step approach to the design and construction of low-temperature measurement apparatus. It is effectively two books in one: a textbook on cryostat design techniques and an appendix data handbook that provides materials-property data for carrying out that design. The main text encompasses a wide range of information. After summarizing cooling methods, Part I provides core information in an accessible style on techniques for cryostat design and fabrication — including heat-transfer design, selection of materials, construction, wiring, and thermometry, acc ... More
This book presents an integrated, step-by-step approach to the design and construction of low-temperature measurement apparatus. It is effectively two books in one: a textbook on cryostat design techniques and an appendix data handbook that provides materials-property data for carrying out that design. The main text encompasses a wide range of information. After summarizing cooling methods, Part I provides core information in an accessible style on techniques for cryostat design and fabrication — including heat-transfer design, selection of materials, construction, wiring, and thermometry, accompanied by many graphs, data, and clear examples. Part II gives a practical user's perspective of sample mounting techniques and contact technology. Part III applies the information from Parts I and II to the measurement and analysis of superconductor critical currents, including in-depth measurement techniques and the latest developments in data analysis and scaling theory. The appendix is a ready reference handbook for cryostat design, encompassing seventy tables compiled from the contributions of experts and over fifty years of literature.
Keywords:
low-temperature measurement,
cryostat design,
cooling methods,
heat-transfer design,
thermometry,
sample mounting,
contact technology,
superconductor critical currents,
scaling theory
Bibliographic Information
| Print publication date: 2006 |
Print ISBN-13: 9780198570547 |
| Published to Oxford Scholarship Online: January 2010 |
DOI:10.1093/acprof:oso/9780198570547.001.0001 |
Authors
Affiliations are at time of print publication.
Jack Ekin, Author
National Institute of Standards and Technology, Boulder, Colorado, USA
More
Less