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Semiconductor Detector Systems$
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Helmuth Spieler

Print publication date: 2005

Print ISBN-13: 9780198527848

Published to Oxford Scholarship Online: September 2007

DOI: 10.1093/acprof:oso/9780198527848.001.0001

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Semiconductor Detector Systems

Helmuth Spieler

Oxford University Press

This chapter leads off with explanations of basic electronic noise mechanisms with simple derivations of spectral noise densities for thermal and shot noise, including the origins and characteristics of ‘1/f’ noise. This is then applied to noise in single and multi-stage amplifiers. Noise matching with both resistive and capacitive signal sources is explained together with the limits of its applicability. The noise characteristics of charge-sensitive feedback amplifiers are derived and explained. Sensor noise models for multi-electrode structures are discussed and noise cross-coupling between multiple amplifiers is analyzed and also applied to backside readout. The chapter closes with a brief description of quantum noise limits in amplifiers.

Keywords:   thermal noise, shot noise, 1/f noise, amplifier noise, noise matching, equivalent noise charge, sensor noise models, noise cross-coupling, backside readout, quantum noise limits

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