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Banhart, John Department of Materials Science, Hahn-Meitner-Institute, Berlin
Print publication date: 2008 (this edition)
Published to Oxford Scholarship Online: May 2008
Print ISBN-13: 978-0-19-921324-5
doi:10.1093/acprof:oso/9780199213245.003.0008
 

Alexandre Simionovici
Pierre Bleuet
Bruno Golosio
Christian Schroer
In cases where the effect of interest changes the direction of the incoming radiation, the image pixels are no longer decoupled and the sample has to be scanned sequentially using a small focused beam to avoid the information from different regions of the sample being convoluted irreversibly. This chapter describes such scanning methods. Three examples are presented: tomography using fluorescent X-ray radiation, tomography exploiting the absorption fine structure near the absorption edges, and tomography utilizing small-angle scattering from mesoscopic structures within the sample.
Keywords: fluorescence tomography, X-ray absorption tomography, small-angle scattering tomography, image pixels, mesoscopic structures
doi:10.1093/acprof:oso/9780199213245.003.0008
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I BASIC CONCEPTS
II SYNCHROTRON X-RAY TOMOGRAPHY
III ELECTRON TOMOGRAPHY
IV NEUTRON TOMOGRAPHY