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Banhart, John Department of Materials Science, Hahn-Meitner-Institute, Berlin
Print publication date: 2008 (this edition)
Published to Oxford Scholarship Online: May 2008
Print ISBN-13: 978-0-19-921324-5
doi:10.1093/acprof:oso/9780199213245.003.0007
 

Yoshio Suzuki
Hiroyuki Toda
Christian Schroer
This chapter describes the principles of Fresnel zone-plate (FZP) optics and imaging properties of FZP microscopy in the context of tomographic application. The limitation of zone-plate optics is discussed, and some typical examples of tomographic imaging experiment are shown. A brief introduction to reflective and refractive X-ray optics is presented since they are used for X-ray microscopy in the hard X-ray range relevant for materials research.
Keywords: Fresnel zone-plate microscopy, microtomography, hard X-rays, FZP microscope
doi:10.1093/acprof:oso/9780199213245.003.0007
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I BASIC CONCEPTS
II SYNCHROTRON X-RAY TOMOGRAPHY
III ELECTRON TOMOGRAPHY
IV NEUTRON TOMOGRAPHY