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Banhart, John Department of Materials Science, Hahn-Meitner-Institute, Berlin
Print publication date: 2008 (this edition)
Published to Oxford Scholarship Online: May 2008
Print ISBN-13: 978-0-19-921324-5
doi:10.1093/acprof:oso/9780199213245.003.0011
 

Paul A. Midgley
Matthew Weyland
This chapter reviews the fundamentals of electron tomography and highlights aspects that are unique to using electrons. Each imaging mode used for electron tomography is discussed. Their benefits and drawbacks are outlined with examples of the diverse range of materials now being studied. Topics covered include tomography using the electron microscope, alignment and reconstruction, bright-field and dark-field electron tomography, HAADF STEM tomography, and EFTEM tomography.
Keywords: bright-field electron tomography, dark-field electron tomography, HAADF STEM tomography, EFTEM tomography
doi:10.1093/acprof:oso/9780199213245.003.0011
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I BASIC CONCEPTS
II SYNCHROTRON X-RAY TOMOGRAPHY
III ELECTRON TOMOGRAPHY
IV NEUTRON TOMOGRAPHY